STM images of atomic-size imperfections on CVD WSe2
XPS survey spectrum measured on a freshly exfoliated surface of WSe2 crystal sample.
Formation of MoSe(2-x)Ox nanorods by etching MoSe2 and annealing in O2
STM image shows the transformation of CVD WSe2 monolayer to WOx using UV-Ozone
High-Resolution XPS (a) W 4f and (b) Se 3d core-level spectra recorded on pristine CVD WSe2 (lower spectra) and after O2 plasma treatment (upper spectra).
Atomically resolved STM image of CVD MoS2 monolayer transferred onto a Au film
Surface Reactivity of MoS2 Studied by Ambient Pressure X-ray Photoelectron Spectroscopy
Dynamic XPS reveals the thermal stability of HfSe2 bulk crystal
XPS measurements reveal a Fermi level variation on three different locations in the same geological MoS2 crystal
The graphene growth on Ni(111) surface by Low Energy Electron Microscopy (LEEM)
Single domain boundary is imaged with 14° tilt angle between domains in Terephthalic acid (TPA). This domain boundary may still be categorized as a small angle grain boundary as it is constructed by a line of dislocation cores
An STM image shows the formation of dislocation during the growth of Bi2Se3 by Molecular beam epitaxy (MBE)
